$China Wholesale Young’s double-slit interference Pricelist – LCP-20 Measurement of Diffraction Intensity -Enhanced Model – Labor Featured Image$

$China Wholesale Young’s double-slit interference Pricelist – LCP-20 Measurement of Diffraction Intensity -Enhanced Model – Labor$

China Wholesale Young’s double-slit interference Pricelist – LCP-20 Measurement of Diffraction Intensity -Enhanced Model – Labor

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We aim to find out high quality disfigurement in the generation and provide the most effective services to domestic and abroad clients wholeheartedly for Abbe Imaging, Young"s Modulus, Brewster"s Angle, Our final target is "To consider the most effective, To be the Best". Please experience cost-free to call with us if you have any prerequisites.

China Wholesale Young’s double-slit interference Pricelist – LCP-20 Measurement of Diffraction Intensity -Enhanced Model – Labor Detail:

This instrument is designed to learn diffraction and interference effects of single-slit, multi-slit, and single-wire.

Specifications

Optical Rail		length: 1.0 m
Semiconductor Laser		3.0 mW @650 nm
DiffractionElement	Single-Slit	slit width: 0.07 mm, 0.10 mm, and 0.12 mm
	Single-Wire	diameter: 0.10 mm and 0.12 mm
	Double-Slit	slit width 0.02 mm , central spacing 0.04 mm
	Double-Slit	slit width 0.07 mm , central spacing 0.14 mm
	Double-Slit	slit width 0.07 mm , central spacing 0.21 mm
	Double-Slit	slit width 0.07 mm , central spacing 0.28 mm
	Triple-Slit	slit width 0.02 mm , central spacing 0.04 mm
	Quadruple-Slit	slit width 0.02 mm , central spacing 0.04 mm
	Pentuple-Slit	slit width 0.02 mm , central spacing 0.04 mm
Photocell Detector (Option 1)		incl 0.1 mm reading ruler & amplifier, connected to a galvanometer
CCD (Option 2)		pixel number: 2700; size: 11×11 μm; spectral range: 0.3~0.9 μm
CCD (Option 2)		with synchronization/signal ports, connected to an oscilloscope
CCD+Software (Option 3)		incl Option 2
CCD+Software (Option 3)		data acquisition box and software for PC use via USB

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Diffraction Intensity