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China Wholesale V-I Characteristics Factories – LEEM-3 Electrostatic Field Mapping Apparatus – Labor

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China Wholesale V-I Characteristics Factories – LEEM-3 Electrostatic Field Mapping Apparatus – Labor Detail:

In engineering technology, it is often necessary to know the electric field distribution of the electrode system in order to study the motion law of electrons or charged particles in the electric field. For example, in order to study the focusing and deflection of electron beam in the oscilloscope tube, it is necessary to know the distribution of the electric field of the electrode in the oscilloscope tube. In the electron tube, we need to study the influence of the introduction of new electrodes on the movement of electrons, and we also need to know the distribution of electric field. Generally speaking, in order to find out the distribution of electric field, analytical method and simulation experiment method can be used. But only in a few simple cases can the electric field distribution be obtained by analytical method. For the general or complex electrode system, it is usually determined by simulation experiment. The disadvantage of the simulation experiment method is that the precision is not high, but for the general engineering design, it can meet the requirements.

 

Functions

1. Learn to study electrostatic fields using simulation method.

2. Deepen the understanding on concepts of strength and potential of electric fields.

3. Map the equipotential lines and electric field lines of the two electrode patterns of a coaxial cable and a pair of parallel wires.

 

Specifications

Description Specifications
Power supply 0 ~ 15 VDC, continuously adjustable
Digital voltmeter range -19.99 V to 19.99 V, resolution 0.01 V
Parallel wire electrodes Electrode diameter 20 mmDistance between electrodes 100 mm
Coaxial electrodes Diameter of central electrode 20 mmWidth of ring electrode 10 mmDistance between electrodes 80 mm

 

Parts List

Item Qty
Main electric unit 1
Conductive glass and carbon paper support 1
Probe and needle  support 1
Conductive glass plate 2
Connection wire 4
Carbon paper 1 bag
Optional conductive glass plate:focusing electrode & non-uniform field electrode each one
Instruction manual 1 (Electronic version)

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China Wholesale V-I Characteristics Factories –  LEEM-3 Electrostatic Field Mapping Apparatus – Labor detail pictures


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