China Wholesale Single-Wire Factory – LCP-25 Experimental Ellipsometer – Labor

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China Wholesale Single-Wire Factory – LCP-25 Experimental Ellipsometer – Labor Detail:

Introduction

The manual elliptical polarimeter uses the extinction method to measure the thickness and refractive index of the film, and manually regulates the deviation and deviation angle of the test process. Ellipsometry is widely used in the measurement of dielectric thin film on solid substrate. In the method of measuring the thickness of the film, it can be measured to the thinnest and the highest precision.

Specifications

Description	Specifications
Thickness Measurement Range	1 nm ~ 300 nm
Range of Incident Angle	30º ~ 90º , Error ≤ 0.1º
Polarizer & Analyzer Intersection Angle	0º ~ 180º
Disk Angular Scale	2º per scale
Min. Reading of Vernier	0.05º
Optical Center Height	152 mm
Work Stage Diameter	Φ 50 mm
Overall Dimensions	730x230x290 mm
Weight	Approximately 20 kg

Part List

Description	Qty
Ellipsometer Unit	1
He-Ne Laser	1
Photoelectric Amplifier	1
Photo Cell	1
Silica Film on Silicon Substrate	1
Analysis Software CD	1
Instruction Manual	1

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Our organization sticks to your principle of "Quality may be the life of your organization, and reputation will be the soul of it" for China Wholesale Single-Wire Factory – LCP-25 Experimental Ellipsometer – Labor , The product will supply to all over the world, such as: Cyprus, Ottawa, Seattle, We will do our utmost to cooperate & satisfied with you relying on top-grade quality and competitive price and best after service ,sincerely look forward to cooperating with you and make achievements in the future!

Brewster's Angle

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