China Wholesale Malus Law Factories – LCP-25 Experimental Ellipsometer – Labor

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China Wholesale Malus Law Factories – LCP-25 Experimental Ellipsometer – Labor Detail:

Introduction

The manual elliptical polarimeter uses the extinction method to measure the thickness and refractive index of the film, and manually regulates the deviation and deviation angle of the test process. Ellipsometry is widely used in the measurement of dielectric thin film on solid substrate. In the method of measuring the thickness of the film, it can be measured to the thinnest and the highest precision.

Specifications

Description	Specifications
Thickness Measurement Range	1 nm ~ 300 nm
Range of Incident Angle	30º ~ 90º , Error ≤ 0.1º
Polarizer & Analyzer Intersection Angle	0º ~ 180º
Disk Angular Scale	2º per scale
Min. Reading of Vernier	0.05º
Optical Center Height	152 mm
Work Stage Diameter	Φ 50 mm
Overall Dimensions	730x230x290 mm
Weight	Approximately 20 kg

Part List

Description	Qty
Ellipsometer Unit	1
He-Ne Laser	1
Photoelectric Amplifier	1
Photo Cell	1
Silica Film on Silicon Substrate	1
Analysis Software CD	1
Instruction Manual	1

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Our business promises all users of the first-class items and the most satisfying post-sale company. We warmly welcome our regular and new prospects to join us for China Wholesale Malus Law Factories – LCP-25 Experimental Ellipsometer – Labor , The product will supply to all over the world, such as: Bolivia, Bogota, Naples, We follow up the career and aspiration of our elder generation, and we are eager to open up a new prospect in this field, We insist on "Integrity, Profession, Win-win Cooperation", because we have a strong backup, that are excellent partners with advanced manufacturing lines, abundant technical strength, standard inspection system and good production capacity.

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