$China Wholesale Fresnel diffraction Suppliers – LCP-20 Measurement of Diffraction Intensity -Enhanced Model – Labor Featured Image$

$China Wholesale Fresnel diffraction Suppliers – LCP-20 Measurement of Diffraction Intensity -Enhanced Model – Labor$

China Wholesale Fresnel diffraction Suppliers – LCP-20 Measurement of Diffraction Intensity -Enhanced Model – Labor

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Fast and great quotations, informed advisers to help you choose the correct product that suits all your preferences, a short creation time, responsible top quality control and different services for paying and shipping affairs for Brewster"s Angle, Microwave Characteristics, Semiconductor Laser, Being a young increasing organization, we might not the best, but we have been trying our best for being your very good partner.

China Wholesale Fresnel diffraction Suppliers – LCP-20 Measurement of Diffraction Intensity -Enhanced Model – Labor Detail:

This instrument is designed to learn diffraction and interference effects of single-slit, multi-slit, and single-wire.

Specifications

Optical Rail		length: 1.0 m
Semiconductor Laser		3.0 mW @650 nm
DiffractionElement	Single-Slit	slit width: 0.07 mm, 0.10 mm, and 0.12 mm
	Single-Wire	diameter: 0.10 mm and 0.12 mm
	Double-Slit	slit width 0.02 mm , central spacing 0.04 mm
	Double-Slit	slit width 0.07 mm , central spacing 0.14 mm
	Double-Slit	slit width 0.07 mm , central spacing 0.21 mm
	Double-Slit	slit width 0.07 mm , central spacing 0.28 mm
	Triple-Slit	slit width 0.02 mm , central spacing 0.04 mm
	Quadruple-Slit	slit width 0.02 mm , central spacing 0.04 mm
	Pentuple-Slit	slit width 0.02 mm , central spacing 0.04 mm
Photocell Detector (Option 1)		incl 0.1 mm reading ruler & amplifier, connected to a galvanometer
CCD (Option 2)		pixel number: 2700; size: 11×11 μm; spectral range: 0.3~0.9 μm
CCD (Option 2)		with synchronization/signal ports, connected to an oscilloscope
CCD+Software (Option 3)		incl Option 2
CCD+Software (Option 3)		data acquisition box and software for PC use via USB

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Abbe Imaging