$China Wholesale Ellipsometer Quotes – LCP-27 Measurement of Diffraction Intensity – Labor Featured Image$

$China Wholesale Ellipsometer Quotes – LCP-27 Measurement of Diffraction Intensity – Labor$

China Wholesale Ellipsometer Quotes – LCP-27 Measurement of Diffraction Intensity – Labor

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China Wholesale Ellipsometer Quotes – LCP-27 Measurement of Diffraction Intensity – Labor Detail:

Description

The experimental system is mainly composed of several parts, such as experimental light source, diffraction plate, intensity recorder, computer and operation software. Through computer interface, the experimental results can be used as an attachment for optical platform, and it can also be used as an experiment alone. The system has a photoelectric sensor for measuring light intensity and high accuracy displacement sensor. The grating ruler can measure displacement, and accurately measure the distribution of diffraction intensity. Computer controls data acquisition and processing, and the measurement results can be compared with the theoretical formula.

Experiments

1.Test of single slit, multiple slit, porous and multi rectangle diffraction, the law of diffraction intensity changes with experimental conditions

2.A computer is used to record the relative intensity and intensity distribution of single slit, and the width of single slit diffraction is used to calculate the width of the single slit.

3.To observe the intensity distribution of the diffraction of multiple slit, rectangular holes and circular holes

4.To observe the Fraunhofer diffraction of single slit

5.To determine the distribution of light intensity

Specifications

Item	Specifications
He-Ne Laser	>1.5 mW @ 632.8 nm
Single-Slit	0 ~ 2 mm (adjustable) with precision of 0.01 mm
Image Measurement Range	0.03 mm slit width, 0.06 mm slit spacing
Projective Reference Grating	0.03 mm slit width, 0.06 mm slit spacing
CCD System	0.03 mm slit width, 0.06 mm slit spacing
Macro lens	Silicon photocell
AC Power Voltage	200 mm
Measurement Accuracy	± 0.01 mm

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