China Wholesale Double beam IR spectrophotometer Quotes – LADP-7 Integrated Experimental System of Faraday and Zeeman Effects – Labor
China Wholesale Double beam IR spectrophotometer Quotes – LADP-7 Integrated Experimental System of Faraday and Zeeman Effects – Labor Detail:
Faraday effect and Zeeman effect comprehensive experimental instrument is a multi-functional and multi measurement experimental teaching instrument which integrates two kinds of experimental effects reasonably. With this instrument, the conversion measurement of Faraday effect and Zeeman effect can be completed, and the characteristics of magneto-optical interaction can be learned. The instrument can be used in the teaching of Optics and modern physics experiments in Colleges and universities, as well as in the research and application of measuring material properties, spectra and magneto-optical effects.
Experiments
1. Observe Zeeman effect, and understand atomic magnetic moment and spatial quantization
2. Observe the splitting and the polarization of a Mercury atomic spectral line at 546.1 nm
3. Calculate electron charge-mass ratio based on Zeeman splitting amount
4. Observe Zeeman effect at other Mercury spectral lines (e.g. 577 nm, 436 nm & 404 nm) with optional filters
5. Learn how to adjust a Fabry-Perot etalon and apply a CCD device in spectroscopy
6. Measure magnetic field intensity using a Teslameter, and determine magnetic field distribution
7. Observe Faraday effect, and measure Verdet constant using light extinction method
Specifications
| Item | Specifications |
| Electromagnet | B: ~1300 mT; pole spacing: 8 mm; pole dia: 30 mm: axial aperture: 3 mm |
| Power supply | 5 A/30 V (max) |
| Diode laser | > 2.5 mW@650 nm; linearly polarized |
| Etalon | dia: 40 mm; L (air)= 2 mm; passband:>100 nm; R=95%; flatness:< λ/30 |
| Teslameter | range: 0-1999 mT; resolution: 1 mT |
| Pencil mercury lamp | emitter diameter: 6.5 mm; power: 3 W |
| Interference optical filter | CWL: 546.1 nm; half passband: 8 nm; aperture: 20 mm |
| Direct reading microscope | magnification: 20 X; range: 8 mm; resolution: 0.01 mm |
| Lenses | collimating: dia 34 mm; imaging: dia 30 mm, f=157 mm |
Parts List
| Description | Qty |
| Main Unit | 1 |
| Diode Laser with Power Supply | 1 set |
| Magneto-Optic Material Sample | 1 |
| Pencil Mercury Lamp | 1 |
| Mercury Lamp Adjustment Arm | 1 |
| Milli-Teslameter Probe | 1 |
| Mechanical Rail | 1 |
| Carrier Slide | 6 |
| Power Supply of Electromagnet | 1 |
| Electromagnet | 1 |
| Condensing Lens with Mount | 1 |
| Interference Filter at 546 nm | 1 |
| F-P Etalon | 1 |
| Polarizer with Scale Disk | 1 |
| Quarter-Wave Plate with Mount | 1 |
| Imaging Lens with Mount | 1 |
| Direct Reading Microscope | 1 |
| Photo Detector | 1 |
| Power Cord | 3 |
| CCD, USB Interface & Software | 1 set (option 1) |
| Interference filters with mount at 577 & 435 nm | 1 set (option 2) |
Product detail pictures:
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